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03 46 · Advances in Inorganic Phosphate Materials Crystal Structure of Layered Triphosphate ΜηΗ2Ρ3θ10·2Η2θ Counts ' \ '' 1 ■ ' ' Γ ' ' ' 1 26000 18000 - 10000 " 2000 _ i Ί I i ! 1i Ai 1 ^ Ji l Ll A A J i 111 **UXJK^. I || 1 1 II ii . . . . . . 1 25 2 Theta, deg 20 1 ill 1 30 35 (a) Counts j . P 1 , 1 1 . 1 J . , . 1 1 26000 18000 : 10000 - 1 j 2000 I 1I i1 I i 1 | I A* 1 1 11 i .. L . A III A^W W__J 1 IIII 1 il 1 i . Λ 25 2 ^ e t a ? deg l~ 1 I j » 30 Figure 1. The Rietveld plots of ΜηΗ2Ρ3θιο·2Η20 without (a) and with (b) treatment of anisotropic line broadening.
Aranda, S. Bruque, D. M. Poojary, A. Clearfield and J. Sanz, Aluminum Phenylphosphonates: A Fertile Family of Compounds, Inorg. , 37, 4168-78 (1998). (j) J· Rocha, Z. Lin, C. Fernandez, and J-P. Amoureux, Multiple-quantum 27A1 MAS NMR spectroscopy of microporous aluminium methylphosphonate AIMepO-ß, Chem. , 22 , 2513-14 (1996). (h) G. B. Hix, V. J. Carter, D. S. Wragg, R. E. Morris, and P. A. Wright, The synthesis and modification of aluminium phosphonates, J. Mater. , 9, 179-185 (1999). (i) K.
Full-profile fitting for ΜηΗ2Ρ3θιο·2Η20 revealed anisotropic line broadening of reflections, which cannot be explained by crystallite size effects. Table 1 demonstrtes this fact, showing rather high values of full-width-half-maximum (FWHM) for some reflections in comparison with others. Anisotropic line broadening did not allow to reach low discrepancies and to obtain reliable structural data. e. without corrections for broadening). Table 1. The values of FWHM for the reflections in the range 2Θ = 8^10°.